Electron Microscopy Center, EMC

Electron Microscopy Center, EMC

Electron Microscopy Center (EMC) at Arrhenius Laboratory provides modern facilities and expertise on electron microscopy and spectroscopy. EMC has four transmission electron microscopes, three scanning electron microscopes and a variety of sample preparation equipment. Besides supporting research and teaching activities at Stockholm University, the center is also open to other universities, research and industrial institutes. We offer comprehensive hands-on training for users to access our facilities.

Description

Electron Microscopy Center (EMC) is one of the Core Facilities in Nanotechnology (CorNa) at the Faculty of Natural Science, Stockholm University, established in the fall of 2008. It is managed by the Department of Materials and Environmental Chemistry, which has a long tradition and strong scientific competences in structural and materials characterizations. Lately, the facilities are managed by the Materials Analysis Centre at Arrhenius Laboratory (MACAL). Electron microscopy and spectroscopy have been introduced as two of the major research tools in the Department since 1973. Most of the past and existing facilities were acquired thanks to generous donations by the Knut and Alice Wallenberg Foundation. At present, the facilities are being used extensively by a considerable number of researchers in a variety of disciplines, and are heavily involved in inter-disciplinary areas of research. Materials presently studied comprise mesoporous crystals, nano-structured materials, soft/bio-materials, hybrid materials, zeolites, oxides, carbon, alloys, ceramics, semiconductors, catalysts and minerals.

Services

The aim of EMC is to create an open and versatile research environment in the rapidly growing area of materials, nano science and technology. In order to make the facilities available and beneficial to a wide range of users from Stockholm University, as well as other academic and industrial institutes, EMC provides scientific and technical support for all users and offers cost-efficient technical services for the equipment. Users are encouraged to run the instruments by their own. Two scientists, who are responsible for the transmission and scanning electron microscopes, respectively, give the tailor-made training for specific instruments and techniques.

 

Infrastructure/Methods

Transmission Electron Microscopes

  • JEOL JEM-2100 (Schottky field-emission, 80-200 kV) with ultra-resolution polepiece

    - Gatan Ultrascan 1000 CCD camera

    - Gatan Imaging Filter (GIF) Tridiem

    - JEOL energy dispersive X-ray (EDS) spectrometer

    - JEOL STEM BF & ADF detectors

    - Gatan STEM BF & ADF detectors

    - JEOL BEI detector

    - Specimen holders: single-tilting, double-tilting, low-background (beryllium) double-tilting, ultra-high tilt tomography, sliding cover and light-import

  • JEOL JEM-2100 (thermionic emission, 80-200 kV) with high-tilt pole-piece
    - Gatan ES500W Erlangshen camera (upper mounted)
    - Gatan SC1000 Orius camera (bottom mounted)
    - JEOL energy dispersive X-ray (EDS) spectrometer
    - JEOL STEM ADF detectors
    - JEOL BEI detector
    - JEOL precession diffraction device
    - Nanomega precession diffraction device
    - JEOL beam blanking device
    - Specimen holders: single-tilting, double-tilting, low-background (beryllium) double-tilting, ultra-high tilt tomography, dual-axes tomography, low-temperature double-tilting, cryo-transfer double-tilting, cryo-transfer tomography, heating double-tilting, sliding cover and light-import
  • JEOL JEM-3010 with ultra-resolution polepiece (300 kV)
    - TVIPS F-216 CMOS camera
    - Nanomega precession diffraction device
    - Specimen holders: single-tilting, double-tilting, sliding cover and ultra-high tilt tomography
  • JEOL JEM-2000FXII with high-tilt pole-piece (200 kV)
    - Olympus KeenView camera
    - Nanomega precession diffraction device
    - Thermo Scientific energy dispersive X-ray (EDS) spectrometer (NORAN System 7)
    - Specimen holders: double specimen single-tilting, double-tilting and low-background (beryllium) double-tilting

 Scanning Electron Microscopes

  • JEOL JSM-7401F (cold field-emission, 100 V – 30 kV)
    - In-lens secondary electron detector
    - Secondary electron detector (side-mounted)
    - R-filter for energy filtering
    - JEOL STEM BF & ADF detectors
    - Oxford instrument energy dispersive X-ray (EDS) spectrometer
    - Specimen stage electrical-bias
  • JEOL JSM-7000F (Schottky field-emission, 300 V – 30 kV)

- Secondary electron detector
- Multi-segments backscattered electron detector (retractable)

- Oxford Instrument energy dispersive X-ray (EDS) spectrometer
- Oxford Instrument wavelength dispersive (WDS) spectrometer
- Specimen stage electrical-bias

  • Hitachi TM3000 (Thermionic emission, 5kV or 15 kV, low vacuum level)
    - Backscattered electron detector
    - Bruker energy dispersive X-ray (EDS) spectrometer (Quantax 70)

 Sample preparation equipment

  • Ion-milling machine (JEOL Ion-slicer EM-09100IS)
  • Ion-milling machine (Fishione Model 105 TEM Mill)
  • Ion-polishing machine (JEOL cross-section polisher SM-09010)
  • Ultrasonic disk cutter (Fishione Model 170)
  • Dimpling grinder (Fishione Model 200)
  • Plasma cleaner (Fishione Model 1020)
  • Rapid freezing cryo-preparation station (Leica EMCPC)
  • Carbon coaters (JEOL JEC-530 and Balzers)
  • Gold coater (JEOL JFC-1200)
  • Optical microscopes
  • Hotplates

Practical information

New users who want to use the microscopes should contact one of the committee members listed on our website. There are three levels of access to the instruments: (1) short term studies with operator, (2) long term studies with operator, and (3) long term studies without operator. All users are required to obtain the “driving license” in order to use our facilities by their own. The responsible scientists give the tailor-made training for each new user. The instrument fees are categorized in three levels: internal, external academic and external users. Students and staffs employed and associated to Stockholm University pay the internal user fee. No additional fee is needed for training. Master and doctoral students and researchers from other university or academic institutes pay the external academic user fee, which is the internal user fee plus a yearly bench fee. Operator fee for internal user is applied when the training is needed. All non-academic users pay the external user fee. Operator fee for the external use is additionally charged for the training. Long term users from outside Stockholm University are recommended to contact with the Chairman to write a contract. The fees for sample preparations depend on the category of users, kind of sample and equipment used. All practical information and fees in detail can be found in our homepage and the Policy Document.

Interested in Industry collaboration
Department of Materials and Environmental Chemistry
Arrhenius Laboratory, Stockholm University
SE-106 91 Stockholm
+46 (0)8 164505